发明名称 POSITIVE RESIST COMPOSITION AND PATTERN-FORMING METHOD
摘要 A positive resist composition includes: (A) a resin capable of increasing the solubility in an alkali developing solution by the action of an acid, including: (a1) a repeating unit selected from repeating units represented by specific formulae (a1-1) to (a1-3); (a2) a repeating unit represented by a specific formula (a2); and (a3) a repeating unit selected from repeating units represented by specific formulae (a3-1) to (a3-4); (B) a compound capable of generating an acid upon irradiation with actinic ray or radiation, (C) a resin including: at least one of a fluorine atom and a silicon atom; and a group selected from specific groups (x) to (z):(x) an alkali-soluble group, (y) a group capable of decomposing by the action of an alkali developing solution to increase the solubility in the alkali developing solution, and (z) a group capable of decomposing by the action of an acid; and (D) a solvent.
申请公布号 US2008305432(A1) 申请公布日期 2008.12.11
申请号 US20080058223 申请日期 2008.03.28
申请人 FUJIFILM CORPORATION 发明人 KANNA SHINICHI
分类号 G03C1/00;G03F7/20 主分类号 G03C1/00
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