发明名称 DELAY MEASURING DEVICE AND SEMICONDUCTOR DEVICE
摘要 A delay measuring device according to the present invention comprises a memory cell, a delay element and a selector. The memory cell is provided with a non-inversion output terminal and an inversion output terminal, and the memory cell fetches a data value inputted from outside in synchronization with a clock, retains the fetched data value and outputs the retained data value from the non-inversion output terminal and the inversion output terminal. The delay element is connected to the inversion output terminal. The selector selects one of the data value and a delayed data value outputted from the delay element and supplies the selected data value to the memory cell. In the present invention, a comparison result of making a comparison between a delay amount generated in the delayed data value and a time length defined based on the clock is outputted from the non-inversion output terminal.
申请公布号 US2008303544(A1) 申请公布日期 2008.12.11
申请号 US20080127369 申请日期 2008.05.27
申请人 KAWAMURA MAKOTO 发明人 KAWAMURA MAKOTO
分类号 H03K19/00 主分类号 H03K19/00
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