发明名称 Charged particle beam apparatus
摘要 The invention provides a charged particle beam apparatus capable of preventing image errors in a display image and capturing a clear display image. A display image displayed on a display unit has a rectangular shape having sides that are substantially parallel to coordinate axes of a rectangular coordinate system determined by wafer alignment. A charged particle beam is radiated onto an area including a display image in a direction that is not parallel to the coordinate axes of the reference rectangular coordinate system to scan the area. Then, among image information obtained by scanning, only information of a position within the display image is displayed on the image display unit. In this way, a clear display image without brightness variation is obtained.
申请公布号 US2008302962(A1) 申请公布日期 2008.12.11
申请号 US20080155038 申请日期 2008.05.29
申请人 HITACHI HIGH TECHNOLOGIES CORPORATION 发明人 TAKAHASHI NORITSUGU;FUKUDA MUNEYUKI;TODOKORO HIDEO;SATO MITSUGU
分类号 G01N23/225 主分类号 G01N23/225
代理机构 代理人
主权项
地址