发明名称 MEMORY STRUCTURE AND METHOD OF MAKING THE SAME
摘要 A memory structure disclosed in the present invention features a control gate and floating gates being positioned in recessed trenches. A method of fabricating the memory structure includes the steps of first providing a substrate having a first recessed trench. Then, a first gate dielectric layer is formed on the first recessed trench. A first conductive layer is formed on the first gate dielectric layer. After that, the first conductive layer is etched to form a spacer which functions as a floating gate on a sidewall of the first recessed trench. A second recessed trench is formed in a bottom of the first recessed trench. An inter-gate dielectric layer is formed on a surface of the spacer, a sidewall and a bottom of the second recessed trench. A second conductive layer formed to fill up the first and the second recessed trench.
申请公布号 US2008305593(A1) 申请公布日期 2008.12.11
申请号 US20070949786 申请日期 2007.12.04
申请人 HSIAO CHING-NAN;LEE PEI-ING;CHANG MING-CHENG;HUANG CHUNG-LIN;CHANG HSI-HUA;WU CHIH-HSIANG 发明人 HSIAO CHING-NAN;LEE PEI-ING;CHANG MING-CHENG;HUANG CHUNG-LIN;CHANG HSI-HUA;WU CHIH-HSIANG
分类号 H01L21/336 主分类号 H01L21/336
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