发明名称 STAGE SYSTEM AND LITHOGRAPHY APPARATUS PROVIDED WITH SUCH STAGE SYSTEM
摘要 <P>PROBLEM TO BE SOLVED: To improve the performance of an excess operation stage in order to solve the problem that the control of the excess operation stage is made difficult when the deformation of the stage is minimized or evaded. <P>SOLUTION: This stage system for a lithography apparatus includes the stage, an excessively specified number of actuators arranged so as to operate on the stage, and a power source configured to supply currents to the actuators. The currents are supplied to a coil related to the first actuator of the actuators and a coil related to the second actuator of the actuators. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008300828(A) 申请公布日期 2008.12.11
申请号 JP20080134920 申请日期 2008.05.23
申请人 ASML NETHERLANDS BV 发明人 DE VOS YOUSSEF KAREL MARIA;KUNST RONALD C;PATRICIA VREUGDEWATER;HEMPENIUS PETER PAUL
分类号 H01L21/027;H01L21/68 主分类号 H01L21/027
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