TEST DEVICE AND CALIBRATION DEVICE

摘要

Provided is a test device including: a first comparator and a second comparator which measure a signal-to-be-measured outputted from a device under test, at a timing of a given sampling clock; a judgment unit which judges whether the device under test is good according to the measurement results obtained by the first and the second comparator; a control unit which causes the first and the second comparator to input an adjustment signal to which a jitter has been applied in advance, so as to perform sampling; a skew calculation unit which calculates a skew between the first and the second comparator according to the sampling result obtained by the first comparator and the sampling result obtained by the second comparator; and a phase adjustment unit which adjusts a phase of the signal-to-be-measured or the sampling clock in the first or the second comparator according to the skew calculated by the skew calculation unit.