发明名称 PHASE CHANGE MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a phase change memory device for reducing the contact region of a phase change memory layer and an electrode and increasing integration effect, and to provide a method for manufacturing the same. <P>SOLUTION: The phase change memory device 100 includes an array of phase change memory cells. Each phase change memory cell includes a selecting MOS transistor disposed on a substrate 110. An upright electrode structure 135 is electrically connected to the transistor through a conductive plug 130. An upright phase change memory layer 140 is stacked on the upright electrode structure 135 with a contact area 145, wherein the contact area 145 serves as a phase transition location. By introducing upright heating electrodes 135 and upright phase change memory layers 140, minimum contact area can be achieved, and operation currents can be further reduced. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008300820(A) 申请公布日期 2008.12.11
申请号 JP20080083252 申请日期 2008.03.27
申请人 IND TECHNOL RES INST;POWERCHIP SEMICONDUCTOR CORP;NANYA SCI & TECHNOL CO LTD;PROMOS TECHNOL INC;HUABANG ELECTRONIC CO LTD 发明人 LEE CHIEN-MIN
分类号 H01L27/105;H01L45/00 主分类号 H01L27/105
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