发明名称 ISOLATION STRUCTURE FOR IMAGE SENSOR DEVICE
摘要 Provided is an image sensor device including a substrate with a pixel region and a peripheral region. A first isolation structure is formed on the substrate in the pixel region. The first isolation structure includes a trench having a first depth. A second isolation structure is formed on the substrate in the peripheral region. The second isolation structure includes a trench having a second depth. The first depth is greater than the second depth.
申请公布号 US2008303932(A1) 申请公布日期 2008.12.11
申请号 US20080120019 申请日期 2008.05.13
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD 发明人 WANG WEN-DE;LIU JEN-CHENG;YAUNG DUN-NIAN;CHUANG CHUN-CHIEH;HUNG JYH-MING
分类号 H04N5/335 主分类号 H04N5/335
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