发明名称 Speicher-Diagnose-Vorrichtung
摘要 A memory diagnosis apparatus include an intra-word testing unit that tests for a coupling fault in each bit in each word in a memory, an inter-word testing unit that tests for a coupling fault between words in each sub-array each being plural words in the memory, and an inter-block testing unit that tests for a coupling fault between sub-arrays in the memory.
申请公布号 DE112006002842(T5) 申请公布日期 2008.12.11
申请号 DE20061102842T 申请日期 2006.09.20
申请人 MITSUBISHI ELECTRIC CORP. 发明人 KANAMARU, HIROO;ISHIOKA, TAKUYA
分类号 G11C29/56;G11C11/413;G11C29/10 主分类号 G11C29/56
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