发明名称 |
Speicher-Diagnose-Vorrichtung |
摘要 |
A memory diagnosis apparatus include an intra-word testing unit that tests for a coupling fault in each bit in each word in a memory, an inter-word testing unit that tests for a coupling fault between words in each sub-array each being plural words in the memory, and an inter-block testing unit that tests for a coupling fault between sub-arrays in the memory. |
申请公布号 |
DE112006002842(T5) |
申请公布日期 |
2008.12.11 |
申请号 |
DE20061102842T |
申请日期 |
2006.09.20 |
申请人 |
MITSUBISHI ELECTRIC CORP. |
发明人 |
KANAMARU, HIROO;ISHIOKA, TAKUYA |
分类号 |
G11C29/56;G11C11/413;G11C29/10 |
主分类号 |
G11C29/56 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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