| 摘要 |
PROBLEM TO BE SOLVED: To solve the problem that a route check requires labor and time, since it is necessary to execute a check program and to store and read out values in and from a register of a pin card or the like in order to check whether or not there is abnormality in a route, in a testing device of a semiconductor having a constitution wherein a test head equipped with a plurality of pin cards and the main body of the testing device are connected together by a cable. SOLUTION: A test signal generated by a test signal generating part disposed in the main body of the testing device is outputted for a prescribed time after a power supply is made, and this signal is read out and compared with expectation in each pin card. This makes it possible to automatically perform the route check in a short time. Particularly, it can be checked whether the pin card is surely inserted or not, without requiring time and labor, on the occasion when the pin card is replaced and the power supply is made again. COPYRIGHT: (C)2009,JPO&INPIT
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