| 摘要 |
PROBLEM TO BE SOLVED: To provide a probe unit capable of reducing manufacturing costs. SOLUTION: The probe unit includes a main body part 12 and probe pins 11. The main body part 12 has both a first plate-like supporting part 31 in which first through holes 31a are formed and a second plate-like supporting part 32 which is opposed to the first plate-like supporting part 31 and in which second through holes 32a are formed. Tip parts 21 and base ends 22 of the probe pins 11 are each passed through the first through holes 31a and the second through holes 32a, and the probe pins 11 are supported by the main body part 12 in such a way that their center parts 23 of which the external surfaces are formed in such a way as to have nonconductivity may be curved. The probe pin 11 has a large-diameter part 24 having a diameter larger than the center part 23 as part of the base-end 22. The second through hole 32a is constituted of both a small-diameter hole 41a having a diameter larger than the center part 23 and smaller than the large-diameter part 24 and positioned to the side of the first supporting part 31 and a large-diameter hole 42a having a diameter than the large-diameter part 24 and connected to the small-diameter hole 41a. COPYRIGHT: (C)2009,JPO&INPIT
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