<p>On a surface of a material to be processed, a Mn containing thin film or a CuMn containing alloy thin film is formed by heat treatment (CVD or ALD) by using a Mn containing material gas (or Mn containing material gas and a Cu containing gas) and an oxygen containing gas (for instance, water vapor) as a processing gas. The Mn containing thin film or the CuMn containing alloy thin film can be formed with a high step coverage in a fine recessed section formed on the surface of the material to be processed.</p>
申请公布号
WO2008149844(A1)
申请公布日期
2008.12.11
申请号
WO2008JP60159
申请日期
2008.06.02
申请人
TOKYO ELECTRON LIMITED;NATIONAL UNIVERSITY CORPORATION TOHOKU UNIVERSITY;MATSUMOTO, KENJI;ITOH, HITOSHI;NEISHI, KOJI;KOIKE, JUNICHI