发明名称 AUTOMATED YIELD MONITORING AND CONTROL
摘要 <p>A system is adapted to automatically maintain a desired yield level for a slurry flow. Measurements of the electrical conductivity of a slurry are taken and corrected for the effects of temperature and pressure. The corrected conductivity measurements are used to arrive at a value for system yield. The system automatically determines if the yield is too high or too low relative to a desired level, and controls the rate at which accelerator is added to the slurry in order to increase or decrease yield.</p>
申请公布号 WO2008151281(A1) 申请公布日期 2008.12.11
申请号 WO2008US65919 申请日期 2008.06.05
申请人 W.R. GRACE & CO.-CONN.;HILTON, DENNIS, M.;TAUB, KARL;LIPFORD, KEITH;ZANGHI, PHILIP, A. 发明人 HILTON, DENNIS, M.;TAUB, KARL;LIPFORD, KEITH;ZANGHI, PHILIP, A.
分类号 C23C16/52;B05C5/00 主分类号 C23C16/52
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