Structure of probe pin for testing semiconductor chip,申请号KR20070049188-传众专利搜索

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发明名称	Structure of probe pin for testing semiconductor chip
摘要
申请公布号	KR100873062(B1)	申请公布日期	2008.12.11
申请号	KR20070049188	申请日期	2007.05.21
申请人		发明人
分类号	G01R1/067	主分类号	G01R1/067
代理机构		代理人
主权项
地址

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