发明名称 Method of fabricating GaN
摘要 A method of fabricating a thick gallium nitride (GaN) layer includes forming a porous GaN layer having a thickness of 10-1000 nm by etching a GaN substrate in a reaction chamber in an HCI and NH3 gas atmosphere and forming an in-situ GaN growth layer in the reaction chamber. The method of forming the porous GaN layer and the thick GaN layer in-situ proceeds in a single chamber. The method is very simplified compared to the prior art. In this way, the entire process is performed in one chamber, and in particular, GaN etching and growth are performed using an HVPE process gas such that costs are greatly reduced.
申请公布号 US7462893(B2) 申请公布日期 2008.12.09
申请号 US20060545520 申请日期 2006.10.11
申请人 SAMSUNG CORNING CO., LTD. 发明人 HAN JAI-YONG;CHOI JUN-SUNG;SONG IN-JAE
分类号 C30B25/18;C30B29/38;H01L21/205;H01L21/3065;H01L31/0328;H01L31/0336;H01L31/109 主分类号 C30B25/18
代理机构 代理人
主权项
地址