发明名称 |
Next process-determining method, inspecting method and inspecting apparatus |
摘要 |
There are provided a next process-determining method capable of determining a next process to be carried out next objectively and at the same time in a short time period, as well as an inspecting method and apparatus which are capable of carrying out a predetermined inspection as to an object to be inspected according to the next process-determining method. A sample object is digitized to sample data formed by digital data. The sample data is compressed into compressed sample data according to a predetermined data format. There is calculated a difference data amount between a data amount of the compressed sample data and a data amount of reference data formed by digitizing and compressing a reference sample object in the same manner as the sample object is processed. Which of a plurality of predetermined numerical ranges the difference data amount belongs to is identified. A predetermined process is determined which is associated with the identified numerical range in advance as a next process to be carried out next.
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申请公布号 |
US7463762(B2) |
申请公布日期 |
2008.12.09 |
申请号 |
US20060536861 |
申请日期 |
2006.09.29 |
申请人 |
TDK CORPORATION |
发明人 |
TAKAI MITSURU;SUWA TAKAHIRO |
分类号 |
G06K9/00;G06T1/00;G06T7/00 |
主分类号 |
G06K9/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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