发明名称 Method and apparatus for observing inside structures, and specimen holder
摘要 An object of the invention is to provide a method and apparatus for observing inside structures and a specimen holder, wherein aging degradation of a good sample to a bad sample can be tracked in the same field of view, using the same specimen in order to determine the mechanism of failure. The present invention is a method for observing inside structures. The method comprises irradiating a specimen with a corpuscular beam generated from a corpuscular beam source, detecting transmitted particles transmitted by the specimen, applying a voltage to a portion of the specimen, and observing of a detection status of the transmitted particles in the voltage-applied portion as needed.
申请公布号 US7462830(B2) 申请公布日期 2008.12.09
申请号 US20040912148 申请日期 2004.08.06
申请人 HITACHI LTD. 发明人 TERADA SHOHEI;KAJI KAZUTOSHI;ISAKOZAWA SHIGETO
分类号 G01N23/04;H01J37/28;G01N23/00;G01N23/225;H01L21/66 主分类号 G01N23/04
代理机构 代理人
主权项
地址