| 摘要 |
A method for converting an integrated circuit into a test circuit for validating functionality of the integrated circuit is disclosed. The integrated circuit is formed on a wafer, and includes a first inner node and a second inner node, wherein the first and second nodes are not floating. The method includes: providing a wire; and utilizing the wire to electrically connect the first inner node to the second inner node, wherein the wire crosses a scribe line of the wafer.
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