发明名称 CMP apparatus
摘要 The present invention provides a CMP apparatus less susceptible to slurry adhesion, easy to cleaning off the adhering slurry therefrom and excellent in chemical resistance. The present invention is a CMP apparatus, at least one covered surface selected from the group consisting of a head portion surface and an arm portion surface for holding a polishing target member on a polishing pad, a slurry feed pipe surface and an apparatus main body inside wall being covered with a fluororesin.
申请公布号 US2008299873(A1) 申请公布日期 2008.12.04
申请号 US20070806349 申请日期 2007.05.31
申请人 DAIKIN INDUSTRIES, LTD. 发明人 OZAKI HIDENORI;KOMORI MASAJI;HIGUCHI TATSUYA
分类号 B24B29/02 主分类号 B24B29/02
代理机构 代理人
主权项
地址