| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device and a memory control method to reliably continue operation with degradation of a function even if a flash memory fails. <P>SOLUTION: The semiconductor integrated circuit device is provided with a flash memory, a flash control part controlling re-write and read for the flash memory, and a processor part. The processor part is provided with a normal mode and a fail safe mode as an operation state. In the normal mode, when a defect is detected in verify-operation after data is written in the flash memory, subsequent use of the flash memory is stopped. In the fail safe mode, when a defect is detected in verify-operation after data is written in the flash memory, error correction is performed and use of the flash memory is continued. The device operates in the normal mode normally, when defect is detected in verify-operation after erasing operation of the normal mode, the mode is shifted to the fail safe mode. <P>COPYRIGHT: (C)2009,JPO&INPIT</p> |
