发明名称 INSPECTION SYSTEM FOR CAPACITOR
摘要 PROBLEM TO BE SOLVED: To solve the problem wherein normality or abnormality of a small capacity of capacitor C2 cannot be determined in an analog circuit 14 which is juxtaposed with a large capacity of capacitor C1 and the small capacity of capacitor C2, even if inspecting the combined capacity. SOLUTION: A spike-like voltage waveform having a prescribed frequency is input into a signal line connected with the capacitor C2 from a signal generation means 2. The normality or abnormality of the capacitor C2 can determined by confirming whether the spike-like voltage waveform is remained in a signal v2 output from the analog circuit 14 by using a counting means 6 and a determination means 8, because the frequency of the spike-like voltage waveform is set in a removable frequency band, when the capacitor C2 is normal. The individual capacitor can be inspected using the spike-like voltage waveform set in each frequency band, when the removable frequency bands are different from each other, when juxtaposing in parallel the capacitor C1 and the capacitor C2. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008292399(A) 申请公布日期 2008.12.04
申请号 JP20070140410 申请日期 2007.05.28
申请人 TOYOTA MOTOR CORP 发明人 IMAI KATSUJI
分类号 G01R31/00 主分类号 G01R31/00
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