发明名称 INTEGRATED CIRCUIT DIE WITH LOGICALLY EQUIVALENT BONDING PADS
摘要 An integrated circuit (IC) die includes two bonding pads, that share a common logical function, such as signal input or signal output, separated by the width of the die, and preferably on opposite sides of the die. System-in-package devices are produced by steps including directly electrically connecting one or the other bonding pad to bonding pads of other, functionally different IC dies, with the bonding pads of the other IC dies, to which are connected bonding pads of common logical function of the IC dies of the present invention, being functionally identical but geometrically different. Multchip package devices are produced by stacking the IC dies of the present invention with other IC dies and directly electrically connecting one or the other bonding pad to different bonding pads of the other IC dies.
申请公布号 US2008299704(A1) 申请公布日期 2008.12.04
申请号 US20080137670 申请日期 2008.06.12
申请人 SANDISK IL LTD. 发明人 RONEN AMIR
分类号 H01L21/00 主分类号 H01L21/00
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