发明名称 Multi-well CMOS image sensor and methods of fabricating the same
摘要 Provided is a multi-well CMOS image sensor and a method of fabricating the same. The multi-well CMOS image sensor may include a plurality of photodiodes vertically formed in a region of a substrate, an n+ wall that vertically connects an outer circumference of the photodiodes, and a floating diffusion region that is connected to the photodiodes on a side of the n+ wall to receive charges from the photodiodes, wherein a p-type region is formed between the floating diffusion region and the n+ wall, and the plurality of photodiodes have a multi-potential well structure.
申请公布号 US2008296641(A1) 申请公布日期 2008.12.04
申请号 US20070980628 申请日期 2007.10.31
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM TAEK
分类号 H01L27/146;H01L31/18 主分类号 H01L27/146
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