SEMICONDUCTOR DEVICE, AND GATE WITHSTAND VOLTAGE TEST METHOD

摘要

PROBLEM TO BE SOLVED: To ensure highly accurate screening using simple and inexpensive means in a MOS type semiconductor element. SOLUTION: The semiconductor device 10 of the present invention includes a driver circuit 12 and a MOS type semiconductor element 14 operable by inputting a signal from an output element of the driver circuit 12 into a gate. The driver circuit 12 has: a test voltage application terminal VG for applying gate withstand voltage test voltage to the gate of the MOS type semiconductor element 14 at the time of a gate withstand test; and an output element off means for fixing the output element to an off state at the time of the gate withstand voltage test. COPYRIGHT: (C)2009,JPO&INPIT