发明名称 SILICON NITRIDE FILM DRY ETCHING METHOD
摘要 <p>A dry etching method of the silicon nitride film is provided to dry-etch the silicon nitride film using the mixing gas including the fluorine gas and oxygen gas instead of the gas such as SF6 which causes the global worming. A dry etching method includes the step for preparing the target object on which the silicon nitride film(22) is laminated on the substrate; the step for positioning the target object into the dry etching device in which the high frequency electrode and the opposite electrode is arranged parallel; the step for loading the target object on the high frequency electrode; the step for introducing the fluorine gas and oxygen gas into the dry etching device by lowering the pressure of etching device; the step for etching the silicon nitride film by applying the high frequency to the high frequency electrode.</p>
申请公布号 KR20080106025(A) 申请公布日期 2008.12.04
申请号 KR20080049045 申请日期 2008.05.27
申请人 CASIO COMPUTER CO., LTD. 发明人 TOSAKA HISAO
分类号 H01L21/306;H01L21/3065;H01L29/786 主分类号 H01L21/306
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