发明名称 INSULATED GATE-TYPE SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 <p>A semiconductor 100 has a P- body region 41 and an N- drift region 12 in the order from an upper surface side thereof. A gate trench 21 and a terminal trench 62 passing through the P- body region 41 are formed. The respective trenches are surrounded with P diffusion regions 51, 53 at the bottom thereof. The gate trench 21 builds a gate electrode 22 therein. A P-- diffusion region 52, which is in contact with the end portion in a lengthwise direction of the gate trench 21 and is lower in concentration than the P- body region 41 and the P diffusion region 51, is formed. The P-- diffusion region 52 is depleted prior to the P diffusion region 51 when the gate voltage is off. The P-- diffusion region 52 serves as a hole supply path to the P diffusion region 51 when the gate voltage is on. ® KIPO & WIPO 2009</p>
申请公布号 KR20080106336(A) 申请公布日期 2008.12.04
申请号 KR20087024488 申请日期 2007.01.26
申请人 TOYOTA JIDOSHA KABUSHIKI KAISHA 发明人 TAKAYA HIDEFUMI;HAMADA KIMIMORI;MIYAGI KYOSUKE
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
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