发明名称 METHOD AND APPARATUS FOR PREDICTING DEVICE FAULT
摘要 PROBLEM TO BE SOLVED: To solve problems that since the calculation or the like of correlation to predict the generation of a device fault is necessary, a prediction apparatus is complicated and whether a certain phenomenon is a previous phenomenon related to a fault can be obtained from the past data of fault analysis only in fault analysis after fault generation. SOLUTION: If the existence of a phenomenon causing a fault before the generation of the fault is detected from a log at the time of fault generation when the fault is generated in a device 2, the phenomenon (fault pre-information) causing the fault is registered in a fault pre-information database 21 by an administrator terminal 1. When the fault pre-information is previously known, the fault pre-information is previously registered in the fault pre-information database 21, and when the fault pre-information is known thereafter, the fault pre-information is registered in the fault pre-information database 21 as required. In this embodiment, possibility of previously predicting a fault can be improved by storing the fault pre-phenomenon in the database. A fault prediction report part 22 reports fault prediction to an administrator or a user. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008293441(A) 申请公布日期 2008.12.04
申请号 JP20070140876 申请日期 2007.05.28
申请人 NEC CORP 发明人 KUBOMURA YASUMITSU
分类号 G06F11/30 主分类号 G06F11/30
代理机构 代理人
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