发明名称 |
METHOD FOR MANUFACTURING SOI WAFER |
摘要 |
<p>A manufacturing method of the SOI wafer is provided to increase the productivity of SOI wafer including the SOI layer with uniform thickness of film. A manufacturing method of the SOI wafer comprises the following processes: the process of preparing for the donor wafer(10) consisting of the handle wafer(20) and the silicon substrate; the ion injection process of injecting at least one of the hydrogen ion or the noble gases ion inside the donor wafer and forming the ion implantation layer; the soldering process of welding the side welded of handle wafer and the side ion-implanted of the donor wafer; the stripping process for thinning the donor wafer by peeling off the donor wafer at the ion implantation layer; the etching process of etching the SOI layer and reducing the thickness of the SOI layer; the step for rough etching; the step for measuring the film thickness distribution of the SOI layer after the tub etching; the step for precisely dry-etching based on the film thickness distribution of the measured SOI layer.</p> |
申请公布号 |
KR20080106038(A) |
申请公布日期 |
2008.12.04 |
申请号 |
KR20080049695 |
申请日期 |
2008.05.28 |
申请人 |
SHIN-ETSU CHEMICAL CO., LTD. |
发明人 |
AKIYAMA SHOJI;KUBOTA YOSHIHIRO;ITO ATSUO;TANAKA KOICHI;KAWAI MAKOTO;TOBISAKA YUUJI |
分类号 |
H01L21/20 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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