发明名称 |
SEMICONDUCTOR MEMORY DEVICE |
摘要 |
A semiconductor memory device increase sensing sensitivity by making the impedance between the sense amplifier and an input-output line and impedance between a complementary input-output line and the sense amplifier identical. In a semiconductor memory device, a first and second bit line are coupled with a plurality of memory cells formed in the first memory cell array region, and a first and second complementary bit line are coupled with a plurality of memory cells formed in the second memory cell array region. A first and the second column selection transistor are formed at a first sense circuit area and couple the first bit line and a fist complementary bit line with the first input-output line and the first complementary bit line respectively. A third and the fourth column selection transistor are formed at a second sense circuit area and couple the second bit line and second complementary bit line with the second input-output line and the second complementary bit line respectively.
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申请公布号 |
KR20080105867(A) |
申请公布日期 |
2008.12.04 |
申请号 |
KR20070053990 |
申请日期 |
2007.06.01 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
AHN, HYO JOO;LEE, KYU CHAN;YI, CHUL WOO |
分类号 |
G11C7/18;G11C7/06;G11C7/12 |
主分类号 |
G11C7/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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