发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 A semiconductor memory device increase sensing sensitivity by making the impedance between the sense amplifier and an input-output line and impedance between a complementary input-output line and the sense amplifier identical. In a semiconductor memory device, a first and second bit line are coupled with a plurality of memory cells formed in the first memory cell array region, and a first and second complementary bit line are coupled with a plurality of memory cells formed in the second memory cell array region. A first and the second column selection transistor are formed at a first sense circuit area and couple the first bit line and a fist complementary bit line with the first input-output line and the first complementary bit line respectively. A third and the fourth column selection transistor are formed at a second sense circuit area and couple the second bit line and second complementary bit line with the second input-output line and the second complementary bit line respectively.
申请公布号 KR20080105867(A) 申请公布日期 2008.12.04
申请号 KR20070053990 申请日期 2007.06.01
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 AHN, HYO JOO;LEE, KYU CHAN;YI, CHUL WOO
分类号 G11C7/18;G11C7/06;G11C7/12 主分类号 G11C7/18
代理机构 代理人
主权项
地址