发明名称 METHOD AND APPARATUS FOR A STEPPED-DRIFT MOSFET
摘要 A power metal-oxide-semiconductor field effect transistor (MOSFET) (100) incorporates a stepped drift region including a shallow trench insulator (STI) (112) partially overlapped by the gate (114) and which extends a portion of the distance to a drain region (122). A silicide block extends from and partially overlaps STI (112) and drain region (122). The STI (112) has a width that is approximately 50% to 75% of the drift region.
申请公布号 WO2007103610(A3) 申请公布日期 2008.12.04
申请号 WO2007US61843 申请日期 2007.02.08
申请人 FREESCALE SEMICONDUCTOR INC.;ZHU, RONGHUA;BOSE, AMITAVA;KHEMKA, VISHNU K.;ROGGENBAUER, TODD C. 发明人 ZHU, RONGHUA;BOSE, AMITAVA;KHEMKA, VISHNU K.;ROGGENBAUER, TODD C.
分类号 H01L29/16;H01L21/332 主分类号 H01L29/16
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