发明名称 SEMICONDUCTOR DEVICE, AND INSPECTION METHOD THEREOF
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a semiconductor device capable of preventing unintended switching of function of a semiconductor chip, and capable of switching function of the semiconductor chip without damaging the semiconductor chip at the switching. <P>SOLUTION: As a means for instructing switching of function to a semiconductor chip 3 having a plurality of functions, option terminals 5a-5d connected to a function switching means incorporated in the semiconductor chip 3 are provided on a substrate 2. The option terminals 5a-5d in initial state (normal state) are protected by a resin 7 and an embedding part 12. To switch functions, the connection relationship of the option terminals 5a-5d is changed by removing a part of the resin 7 or the embedding part 12 not to apply a damage on the semiconductor chip 3. <P>COPYRIGHT: (C)2009,JPO&INPIT</p>
申请公布号 JP2008294225(A) 申请公布日期 2008.12.04
申请号 JP20070138217 申请日期 2007.05.24
申请人 ELPIDA MEMORY INC 发明人 KIYOTA GORO;KOBAYASHI KATSUTARO
分类号 H01L23/50;H01L23/00 主分类号 H01L23/50
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