发明名称 Method of Polishing Compound Semiconductor Substrate, Compound Semiconductor Substrate, Method of Manufacturing Compound Semiconductor Epitaxial Substrate, and Compound Semiconductor Epitaxial Substrate
摘要 Compound-semiconductor-substrate polishing methods, compound semiconductor substrates, compound-semiconductor-epitaxial-substrate manufacturing methods, and compound semiconductor epitaxial substrates whereby oxygen superficially present on the substrates reduced. A compound semiconductor-substrate polishing method includes a preparation step (S10), a first polishing step (S20), and a second polishing step (S30). In the preparation step (S10), a compound semiconductor substrate is prepared. In the first polishing step (S20), the compound semiconductor substrate is polished with a chloric polishing agent. In the second polishing step (S30), subsequent to the first polishing step (S20), a polishing operation utilizing an alkaline aqueous solution containing an inorganic builder and having pH of 8.5 to 13.0 inclusive is performed.
申请公布号 US2008299350(A1) 申请公布日期 2008.12.04
申请号 US20070863261 申请日期 2007.09.28
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 MEZAKI YOSHIO;NISHIURA TAKAYUKI;NAKAYAMA MASAHIRO
分类号 B32B3/00;B24B37/00;B32B15/04;H01L21/304 主分类号 B32B3/00
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