ADVANCED PROBE PIN FOR SEMICONDUCTOR TEST

摘要

An advanced probe pin for a semiconductor test, capable of electrically testing normality of a semiconductor device through contact with the semiconductor device, is disclosed. In a probe card which is a semiconductor testing apparatus, the probe pin includes a beam unit including a fixing supporting part additionally formed at an outside of the probe pin and a pin unit establishing an area-contact with a wafer chip of a semiconductor, the beam unit and the pin unit being separately manufactured and then integrated. According to the above structure, connection and separation of the pin unit with respect to the beam unit can be performed promptly and conveniently.