发明名称 DATA TRANSFER DEVICE
摘要 PROBLEM TO BE SOLVED: To flexibly perform test of an interface circuit. SOLUTION: Interface circuits 11a-11d are bus-connected to a CPU 13 to perform input or output of data to each of a corresponding set of external terminals. An interface test circuit 20 is bus-connected to the CPU 13, and includes a selection circuit 22 for selecting one of the interface circuits 11a-11d and selecting whether input or output of data is performed to each of the one set of external terminals related to the selected interface circuit. When the interface circuit functions as an output circuit, the interface test circuit 20 inputs and buffers data output by the interface circuit, so that the data is read by the CPU 13. When the interface circuit functions as an input circuit, the interface test circuit 20 outputs data which is preliminarily written and buffered by the CPU 13 so that the interface circuit inputs the data. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008293120(A) 申请公布日期 2008.12.04
申请号 JP20070135695 申请日期 2007.05.22
申请人 NEC ELECTRONICS CORP 发明人 TSUNEKI KIYOSHI
分类号 G06F13/00 主分类号 G06F13/00
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