| 摘要 |
<p>Provided is an electronic device testing method wherein a stress applying step effective for removing an initial degradation failure product of an electronic device is introduced. The method for testing the electronic device composed of one or a plurality of semiconductor components includes a step of repeating turning on/off a power supply connected to the electronic device while changing the on/off cycle and/or the voltage value of the power supply, and a step of checking whether the electronic device normally operates or not after repeating turning on/off the power supply.</p> |
