| 摘要 |
The invention relates to the identification of points of interest in a region of the surface of a part, by bringing a surface reference into intimate contact with said region, said surface reference consisting of a thin film sufficiently flexible to conform to the region, the thin film supporting tracks made of electrically conductive material, the passage of an eddy current probe over a track delivering a significant signal representative of the track, this representative signal corresponding to a point of interest thus identified in said region. The invention makes it possible in particular to optimize the path and the angular position of an eddy current probe scanning a region of a part to be tested.
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