发明名称 |
METHOD FOR READING E-FUSE DATA IN FLASH MEMORY DEVICE |
摘要 |
A method for reading e-fuse data is provided to obtain reliable E-Fuse data by using low level read voltage and increasing time for reading the E-Fuse data. A method for reading e-fuse data is comprised of steps: setting a read time of configuration data to be different from a read time for normal data; reading the configuration data, especially the configuration data includes information of DC trim, option, repair, and a bad block and a time for reading the configuration data is longer than that for reading the normal data.
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申请公布号 |
KR20080104838(A) |
申请公布日期 |
2008.12.03 |
申请号 |
KR20070052195 |
申请日期 |
2007.05.29 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KANG, SANG GU;LIM, YOUNG HO |
分类号 |
G11C16/26;G11C29/04 |
主分类号 |
G11C16/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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