发明名称 METHOD FOR READING E-FUSE DATA IN FLASH MEMORY DEVICE
摘要 A method for reading e-fuse data is provided to obtain reliable E-Fuse data by using low level read voltage and increasing time for reading the E-Fuse data. A method for reading e-fuse data is comprised of steps: setting a read time of configuration data to be different from a read time for normal data; reading the configuration data, especially the configuration data includes information of DC trim, option, repair, and a bad block and a time for reading the configuration data is longer than that for reading the normal data.
申请公布号 KR20080104838(A) 申请公布日期 2008.12.03
申请号 KR20070052195 申请日期 2007.05.29
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KANG, SANG GU;LIM, YOUNG HO
分类号 G11C16/26;G11C29/04 主分类号 G11C16/26
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