发明名称 PROBE SHEET, PROBE CARD AND METHOD OF MANUFACTURING THE SAME
摘要 The probe sheet which can reduce the manufacturing cost while relieving interference is provided TO accurately measure the electrical characteristic in the fine pitch. The probe sheet(100) includes elastic body bases(121a, 121b) having second side facing the first side and the first side, the first area defined in a part of the first side, a plurality of conduction balls(122) which is exposed to the second part defined in a part of the second side and is arranged in order to electrically connect the first area and the second part.
申请公布号 KR20080104657(A) 申请公布日期 2008.12.03
申请号 KR20070051723 申请日期 2007.05.28
申请人 SECRON CO., LTD. 发明人 SHIM, YOUNG DAE
分类号 G01R1/067 主分类号 G01R1/067
代理机构 代理人
主权项
地址