发明名称 Split-gate non-volatile EPROM memory cells and method of manufacturing the same
摘要 <p>A method of forming a split-gate non-volatile EPROM memory cell which includes forming first and second adjacent floating gates self-aligned to a field oxide region (111) therebetween. An oxide layer (131) is formed covering the first and second adjacent floating gates (131) and the field oxide region, the oxide layer electrically isolating the first and second adjacent floating gates from one another. A control gate (137) is formed on the oxide layer on the first and second adjacent floating gates (131). Related devices are also disclosed. </p>
申请公布号 EP1619721(A3) 申请公布日期 2008.12.03
申请号 EP20050254365 申请日期 2005.07.12
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YOON, SEUNG-BEOM;HAN, JEONG-UK;KIM, YONG-TAE;JEON, HEE-SEOG
分类号 H01L27/115;H01L21/336;H01L21/8247 主分类号 H01L27/115
代理机构 代理人
主权项
地址