发明名称 |
Split-gate non-volatile EPROM memory cells and method of manufacturing the same |
摘要 |
<p>A method of forming a split-gate non-volatile EPROM memory cell which includes forming first and second adjacent floating gates self-aligned to a field oxide region (111) therebetween. An oxide layer (131) is formed covering the first and second adjacent floating gates (131) and the field oxide region, the oxide layer electrically isolating the first and second adjacent floating gates from one another. A control gate (137) is formed on the oxide layer on the first and second adjacent floating gates (131). Related devices are also disclosed.
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申请公布号 |
EP1619721(A3) |
申请公布日期 |
2008.12.03 |
申请号 |
EP20050254365 |
申请日期 |
2005.07.12 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
YOON, SEUNG-BEOM;HAN, JEONG-UK;KIM, YONG-TAE;JEON, HEE-SEOG |
分类号 |
H01L27/115;H01L21/336;H01L21/8247 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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