发明名称 NON-VOLATILE MEMORY DEVICE CAPABLE OF MULTI BIT PROGRAMING AND THE METHOD FOR MANUFACTURING THE SAME
摘要 <p>The non-volatile memory device and the method for manufacturing the same are provided to achieve one cell-two bit program of the low voltage, micro type, highly integrated, high-end, high reliability. The non-volatile memory device comprises the semiconductor substrate(21), the tunnel insulating layer(22), the charge trapping layer(23), the memory layer(25), the gate electrode layer(26). The source and drain region(27) are formed in the semiconductor substrate. The tunnel insulating layer has the step height which the central part is lower than the peripheral unit. The charge trapping layer has the step height which the lower surface of both sides is lower than the upper surface of the central part. The memory layer comprises the blocking insulating layer formed on the charge trapping layer. The gate electrode layer is formed on the blocking insulating layer.</p>
申请公布号 KR100871605(B1) 申请公布日期 2008.12.02
申请号 KR20070087801 申请日期 2007.08.30
申请人 KOREA UNIVERSITY INDUSTRIAL & ACADEMIC COLLABORATION FOUNDATION 发明人 KIM, TAE GEUN;AN, HO MYOUNG;KIM, KYOUNG CHAN;SEO, YU JEONG;KIM, HEE DONG
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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