发明名称 |
Output data compression scheme using tri-state |
摘要 |
A memory device uses data compression to read data from an array of the memory during testing. The compressed data is either a logic one, logic zero or tri-state, depending upon the data read from the array. Output drivers of the memory are placed in a tri-state condition in response to a detected read error. Non-compressed internal I/O lines are used during testing to provide control signals to the driver circuitry to selectively place drivers in the tri-state mode. Once a tri-state is detected four columns of memory cells can be replaced with four columns of redundant memory cells without requiring additional non-compressed testing.
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申请公布号 |
US7461306(B2) |
申请公布日期 |
2008.12.02 |
申请号 |
US20060409729 |
申请日期 |
2006.04.24 |
申请人 |
MICRON TECHNOLOGY, INC. |
发明人 |
ROOHPARVAR FRANKIE FARIBORZ |
分类号 |
G11C29/00;G11C29/40;H03M13/00 |
主分类号 |
G11C29/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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