发明名称 Beam alignment in spectroscopic microscopes
摘要 A spectroscopic microscope includes a laser or other light source which emits light from the entrance aperture of its spectrograph, and also includes a light sensor situated on the microscope sample stage upon which a specimen is to be situated for microscopic/spectrometric analysis. The sample stage is positioned such that the signal from the light sensor is maximized, thereby indicating good alignment between the sample stage and spectrograph. Additionally, the microscope sample stage bears a light source which can emit light to be detected by a light sensor situated at the vantage point of a user/viewer utilizing the microscope, and such a light sensor can simply take the form of a video camera or other image recordation unit associated with the microscope. The sample stage can also be positioned to optimize the signal at the light sensor to signify good alignment between the sample stage and the microscope.
申请公布号 US7460229(B2) 申请公布日期 2008.12.02
申请号 US20060332675 申请日期 2006.01.13
申请人 THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLC 发明人 DECK FRANCIS J.;HODKIEWICZ JOE
分类号 G01J3/42;G01B11/00;G01J3/40 主分类号 G01J3/42
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