SPECTRAL MEASURING SYSTEM FOR DETERMINING SUBSTANCE PROPERTIES USING TERAHERTZ RADIATION

摘要

A spectral measuring system for determining substance properties using terahertz radiation, comprising one or more radiation sources (10; 410), of which at least one radiation source (10) can be adjusted or configured regarding the wavelength thereof, the first radiation source (10; 410) emitting a first radiation (S1; S401) having a predefined first wavelength, characterized by a sensor (90), which responds to further radiation (S9; S409), which is based on the radiation (S1; S401) of the at least one radiation source (10; 410), and further by a controller (40; 440), which is connected to the at least one radiation source (10; 410) and to the sensor (90; 490), wherein the controller (40; 440) is configured to control the at least one radiation source (10; 410), adjust the wavelength of the at least one adjustable radiation source (10; 410), and read the sensor (90; 490).