发明名称 SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device capable of suppressing the peeling caused by a difference in shrinkage coefficients of a metal island and a mold resin and having improved product reliability. <P>SOLUTION: A semiconductor device 10 of the present invention is provided with a metal island 12, a semiconductor chip 16 mounted on the metal island 12, and a mold resin layer 24 for sealing the metal island 12 and the semiconductor chip 16. The interface between the side face of the metal island 12 and the mold resin layer 24 is provided with a buffer film 13 with an elastic modulus lower than that of the mold resin layer 24. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008288566(A) 申请公布日期 2008.11.27
申请号 JP20080087750 申请日期 2008.03.28
申请人 NEC ELECTRONICS CORP 发明人 KIMURA NAOTO
分类号 H01L23/50 主分类号 H01L23/50
代理机构 代理人
主权项
地址