发明名称 AIRFLOW MANAGEMENT FOR PARTICLE ABATEMENT IN SEMICONDUCTOR MANUFACTURING EQUIPMENT
摘要 An airflow management system and/or method used in particle abatement in semiconductor manufacturing equipment. In particular, the apparatus disclosed is capable of creating and managing a carefully controlled particle free environment for the handling of semiconductor wafers or similar articles. The apparatus is particularly suited to be used as an interface between an equipment front end module (EFEM) and a vacuum loadlock chamber or other such article of process equipment. The apparatus also enables relative motion between enclosures while maintaining a particle free environment utilizing a moving air diffuser mounted to an interface panel.
申请公布号 US2008292432(A1) 申请公布日期 2008.11.27
申请号 US20070752118 申请日期 2007.05.22
申请人 CASTANTINI JAMES S;TAO TENT-CHAO D;MADDEN ERIN M;POLNER DONALD N 发明人 CASTANTINI JAMES S.;TAO TENT-CHAO D.;MADDEN ERIN M.;POLNER DONALD N.
分类号 H01L21/677;B65G49/07;F24F13/00 主分类号 H01L21/677
代理机构 代理人
主权项
地址