发明名称 Holographic interferometry for non-destructive testing of power sources
摘要 The present invention is connected with the holographic interferometry method and device that provides, to a very high precision, the reconstructing the original waveform of light emitted or reflected by an object. This method allows image resolution close to that of the wavelength of the light being used. The non-destructive method of holographic interferometry coupled with impulse heating of the test article to allow observation of its dynamic response to operating conditions, as described herein, is one of the most effective non-contact automated quality control methods available.
申请公布号 US2008291458(A1) 申请公布日期 2008.11.27
申请号 US20080152740 申请日期 2008.05.16
申请人 ENERIZE CORPORATION 发明人 REDKO VOLODYMYR;SHEMBEL ELENA M.;SOKHACH YURII V.;KUDREVATYKH OLEXANDR
分类号 G01B9/021 主分类号 G01B9/021
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