发明名称 METHOD OF ANALYZING PHOTODEGRADATION CHARACTERISTIC OF LIQUID CRYSTAL PANEL
摘要 PROBLEM TO BE SOLVED: To solve the problems wherein, since separation between deterioration of an orientation film constituted mainly of an organic substance generated simultaneously with deterioration of a liquid crystal unit and deterioration caused by interaction between the orientation film and the liquid crystal is difficult, extraction of a deterioration factor based on measurement results is difficult, and elongation of a lifetime of a liquid crystal panel by improving the deterioration factor is also difficult. SOLUTION: A measuring optical system including a polarizing plate and a light source is arranged in the first liquid crystal panel 20a, and a relation between a voltage applied to two transparent electrodes 22 carried by the first liquid crystal panel 20a and an optical transmittance is determined. Then, a photodegradation test of an initial liquid crystal 10 unit is performed in a condition not including the orientation film 23. Thereafter, a photodegradation test is performed in a condition not including the initial liquid crystal 10. Successively, a photodegradation test by interaction between the initial liquid crystal 10 and the orientation film 23 is performed by sandwiching the initial liquid crystal 10 between the orientation film 23. Hereby, a photodegradation amount caused by the interaction between the initial liquid crystal 10 and the orientation film 23 is extracted from each test result. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008286620(A) 申请公布日期 2008.11.27
申请号 JP20070131322 申请日期 2007.05.17
申请人 SEIKO EPSON CORP 发明人 ISOBE AKIRA
分类号 G01N30/06;G01N30/72;G01N30/88;G02F1/13 主分类号 G01N30/06
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