Microwave-supported non-destructive examination arrangement for workpiece i.e. non-metallic workpiece, has quadrature-amplitude modulator with two multipliers having respective outputs that are led to inputs of eddy current tester

摘要

The arrangement has a quadrature-amplitude modulator (4) with two multipliers (13, 14) that are connected with respective outputs for defective information carrying signals (x, y) of a microwave non-destructive device (1) on an input side. The multiplier (13) has an input that is engaged with a phase-shifted output signal of an eddy current tester (2). The multiplier (14) has an input that is engaged with unmodified output signal of the eddy current tester, where the two multiplexers have respective outputs that are led to inputs of the eddy current tester.