发明名称 CHEMICALLY AMPLIFIED RESIST MATERIAL, TOPCOAT FILM FORMING MATERIAL AND PATTERN FORMING METHOD USING THEM
摘要 <P>PROBLEM TO BE SOLVED: To improve the resolution of a pattern in a chemically amplified resist. <P>SOLUTION: A resist film 102 comprising a chemically amplified resist containing a polymer, a photoacid generator and a carbamoyloxime is formed on a substrate 101. The resist film 102 is selectively irradiated with exposure light 104 to perform pattern exposure. The resist film 102 subjected to the pattern exposure is heated and the heated resist film 102 is developed, whereby a resist pattern 102a is formed from the resist film 102. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008286924(A) 申请公布日期 2008.11.27
申请号 JP20070130425 申请日期 2007.05.16
申请人 PANASONIC CORP 发明人 ENDO MASATAKA;SASAKO MASARU
分类号 G03F7/039;G03F7/004;G03F7/11;H01L21/027 主分类号 G03F7/039
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