发明名称 |
IN-PROCESS VISION DETECTION OF FLAWS AND FOD BY BACK FIELD ILLUMINATION |
摘要 |
A flaw and foreign object debris (FOD) detection system (11) for use during fabrication of a structure (12) includes an illumination device (13). The illumination device (13) is configured to be in proximity with a fabrication system (10) and illuminates a portion (18) of the structure (12). The illumination device (13) directs light rays (16) at acute angles relative to the portion (18). A detector (14) monitors the portion (18) and detects FOD in the portion (18) during fabrication of the structure (12) in response to the reflection of the light rays (16) off of the portion (18).
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申请公布号 |
US2008289742(A1) |
申请公布日期 |
2008.11.27 |
申请号 |
US20080179659 |
申请日期 |
2008.07.25 |
申请人 |
THE BOEING COMPANY |
发明人 |
ENGELBART ROGER W.;HANNEBAUM REED;POLLOCK TIM |
分类号 |
B32B38/00 |
主分类号 |
B32B38/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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